PG-EAM - Graduate Program in Aeronautical and Mechanical Engineering
PT EN
Article 2021

Effect of plasma-enhanced atomic layer deposition on oxygen overabundance and its influence on the morphological, optical, structural, and mechanical properties of al-doped tio2 coating

Authors

Chiappim, William
Testoni, Giorgio
Miranda, Felipe
Fraga, Mariana
Furlan, Humber
Saravia, David Ardiles
Maciel, Homero
Pessoa, Rodrigo

Micromachines , vol. 12 , no. 6 , Article 588

10
Citations
10
Authors

Abstract

© 2021 by the authors. Licensee MDPI, Basel, Switzerland.The chemical, structural, morphological, and optical properties of Al-doped TiO2 thin films, called TiO2/Al2O3 nanolaminates, grown by plasma-enhanced atomic layer deposition (PEALD) on p-type Si <100> and commercial SLG glass were discussed. High-quality PEALD TiO2/Al2O3 nanolam-inates were produced in the amorphous and crystalline phases. All crystalline nanolaminates have an overabundance of oxygen, while amorphous ones lack oxygen. The superabundance of oxygen on the crystalline film surface was illustrated by a schematic representation that described this phenomenon observed for PEALD TiO2/Al2O3 nanolaminates. The transition from crystalline to amorphous phase increased the surface hardness and the optical gap and decreased the refractive index. Therefore, the doping effect of TiO2 by the insertion of Al2O3 monolayers showed that it is possible to adjust different parameters of the thin-film material and to control, for example, the mobility of the hole-electron pair in the metal-insulator-devices semiconductors, corrosion protection, and optical properties, which are crucial for application in a wide range of technological areas, such as those used to manufacture fluorescence biosensors, photodetectors, and solar cells, among other devices.

Keywords

Aluminum oxide Doping Nanolami-nates Plasma-enhanced atomic layer deposition Superstoichiometry Titanium dioxide

Control and Systems Engineering (ENGI) Mechanical Engineering (ENGI) Electrical and Electronic Engineering (ENGI)
: Scopus
Last Update: 2026-06-25
: 2-s2.0-85107184572